TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_55_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-008-15 | FUSED_ID : 6359364768380260495
  IC_TEMP :  -66.22 | VDDM : 1129.34 | AUX_INT :   -8.79 | CsaBias :   66.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38119e-03 / 2
  ADC_P0  : -8.79466e-03 ± 2.52355e-02
  ADC_P1  : 8.41236e-03 ± 6.30420e-04
  ADC_P2  : -5.19370e-06 ± 3.13875e-06
  CSA_Chi2/NDF : 1.66754e-04 / 2
  CSA_P0  : 5.87790e-02 ± 8.61312e-03
  CSA_P1  : 1.02042e-02 ± 6.48937e-04
  CSA_P2  : -5.86993e-05 ± 9.88254e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [8, 45, 48, 51, 64, 65, 67, 103, 109, 113, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [7, 12, 18, 40, 42, 43, 69, 70, 75, 84, 100, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3899', '1.800', '0.1547', '1.800', '0.0963', '7.000', '0.7079', 1, 1, 1, 1, 1723805741.2129238]
VI_after__Init : ['1.202', '0.3907', '1.800', '0.1549', '1.800', '0.0890', '7.000', '0.7072', 1, 1, 1, 1, 1723805749.1953716]
VI_at__the_End : ['1.201', '0.4641', '1.800', '0.1398', '1.802', '0.1190', '7.000', '0.7079', 1, 1, 1, 1, 1723805803.9753654]