TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_53_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-009-15 | FUSED_ID : 6359364768380260511
  IC_TEMP :  -62.03 | VDDM : 1128.67 | AUX_INT :   -7.71 | CsaBias :   67.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17867e-03 / 2
  ADC_P0  : -7.71343e-03 ± 2.32802e-02
  ADC_P1  : 8.36565e-03 ± 5.75732e-04
  ADC_P2  : -5.56229e-06 ± 2.82067e-06
  CSA_Chi2/NDF : 1.76780e-04 / 2
  CSA_P0  : 5.71622e-02 ± 8.86826e-03
  CSA_P1  : 1.00477e-02 ± 6.68159e-04
  CSA_P2  : -5.45208e-05 ± 1.01753e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [7, 24, 29, 44, 50, 57, 58, 62, 68, 85, 102, 105, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [24, 30, 31, 40, 44, 66, 72, 74, 77, 86, 105, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3519', '1.800', '0.1688', '1.800', '0.0922', '7.000', '0.7072', 1, 1, 1, 1, 1723805634.6027627]
VI_after__Init : ['1.202', '0.3520', '1.800', '0.1689', '1.799', '0.0875', '7.000', '0.7073', 1, 1, 1, 1, 1723805641.921154]
VI_at__the_End : ['1.202', '0.4691', '1.800', '0.1349', '1.803', '0.1171', '7.000', '0.7079', 1, 1, 1, 1, 1723805698.9250026]