TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_52_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-010-15 | FUSED_ID : 6359364768380260527
  IC_TEMP :  -64.00 | VDDM : 1125.88 | AUX_INT :   -9.24 | CsaBias :   67.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35258e-03 / 2
  ADC_P0  : -9.24036e-03 ± 2.49253e-02
  ADC_P1  : 8.58036e-03 ± 6.26704e-04
  ADC_P2  : -5.83974e-06 ± 3.14007e-06
  CSA_Chi2/NDF : 1.89624e-04 / 2
  CSA_P0  : 5.95652e-02 ± 9.18477e-03
  CSA_P1  : 1.03385e-02 ± 6.92006e-04
  CSA_P2  : -5.84194e-05 ± 1.05384e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [4, 26, 83, 85, 90, 99, 101, 108, 109, 114, 117, 122]
 | N_BROKEN_SLOW :  [90]
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 28, 31, 55, 58, 60, 61, 77, 82, 90, 91, 94, 104, 109, 117, 127]
 | P_BROKEN_SLOW :  [90]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4522', '1.800', '0.1502', '1.799', '0.1007', '7.000', '0.7074', 1, 1, 1, 1, 1723805527.8523848]
VI_after__Init : ['1.202', '0.4532', '1.800', '0.1508', '1.801', '0.0947', '7.000', '0.7073', 1, 1, 1, 1, 1723805536.019815]
VI_at__the_End : ['1.201', '0.4740', '1.800', '0.1391', '1.804', '0.1166', '7.000', '0.7080', 1, 1, 1, 1, 1723805591.5907962]