TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_48_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-012-15 | FUSED_ID : 6359364768380260559
  IC_TEMP :  -60.54 | VDDM : 1115.64 | AUX_INT :   -8.23 | CsaBias :   67.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09595e-03 / 2
  ADC_P0  : -8.22826e-03 ± 2.24120e-02
  ADC_P1  : 8.51267e-03 ± 5.59698e-04
  ADC_P2  : -5.90023e-06 ± 2.77514e-06
  CSA_Chi2/NDF : 1.42246e-04 / 2
  CSA_P0  : 6.12719e-02 ± 7.95504e-03
  CSA_P1  : 1.04799e-02 ± 5.99355e-04
  CSA_P2  : -5.97603e-05 ± 9.12746e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [7, 34, 44, 48, 55, 63, 64, 72, 73, 78, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 53, 58, 64, 89, 106, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4186', '1.800', '0.1843', '1.800', '0.0942', '7.000', '0.7082', 1, 1, 1, 1, 1723805314.5434272]
VI_after__Init : ['1.202', '0.4192', '1.800', '0.1848', '1.801', '0.0867', '7.000', '0.7072', 1, 1, 1, 1, 1723805322.5839534]
VI_at__the_End : ['1.201', '0.4800', '1.800', '0.1391', '1.799', '0.1170', '7.000', '0.7079', 1, 1, 1, 1, 1723805380.2119033]