TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_46_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-013-15 | FUSED_ID : 6359364768380260575
  IC_TEMP :  -67.04 | VDDM : 1127.25 | AUX_INT :   -9.70 | CsaBias :   67.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45031e-03 / 2
  ADC_P0  : -9.69777e-03 ± 2.57820e-02
  ADC_P1  : 8.64543e-03 ± 6.42528e-04
  ADC_P2  : -6.50901e-06 ± 3.18556e-06
  CSA_Chi2/NDF : 1.44649e-04 / 2
  CSA_P0  : 6.08702e-02 ± 8.02194e-03
  CSA_P1  : 1.05419e-02 ± 6.04395e-04
  CSA_P2  : -6.10115e-05 ± 9.20423e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [1, 3, 7, 12, 27, 32, 44, 48, 50, 56, 60, 61, 71, 86, 87, 92, 101, 103, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [3, 7, 26, 40, 48, 58, 91, 92, 98, 99, 116, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2571', '1.800', '0.1629', '1.800', '0.0880', '7.000', '0.7079', 1, 1, 1, 1, 1723805208.9566798]
VI_after__Init : ['1.202', '0.2571', '1.800', '0.1630', '1.801', '0.0809', '7.000', '0.7072', 1, 1, 1, 1, 1723805216.8971815]
VI_at__the_End : ['1.202', '0.4787', '1.800', '0.1387', '1.799', '0.1156', '7.000', '0.7079', 1, 1, 1, 1, 1723805273.6262934]