TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_37_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-018-08 | FUSED_ID : 6359364768380260648
  IC_TEMP :  -67.46 | VDDM : 1121.87 | AUX_INT :  -11.24 | CsaBias :   59.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.88603e-03 / 2
  ADC_P0  : -1.12444e-02 ± 2.94207e-02
  ADC_P1  : 8.93304e-03 ± 7.49818e-04
  ADC_P2  : -7.05714e-06 ± 3.81720e-06
  CSA_Chi2/NDF : 1.88936e-04 / 2
  CSA_P0  : 6.30594e-02 ± 9.16811e-03
  CSA_P1  : 1.12917e-02 ± 6.90751e-04
  CSA_P2  : -7.22601e-05 ± 1.05193e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [10, 34, 46, 48, 72, 77, 82, 89, 115, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [25, 27, 30, 60, 74, 84, 85, 93, 99, 101, 102, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3849', '1.800', '0.1266', '1.800', '0.0974', '7.000', '0.7072', 1, 1, 1, 1, 1723804676.9356773]
VI_after__Init : ['1.201', '0.3852', '1.800', '0.1268', '1.800', '0.0917', '7.000', '0.7075', 1, 1, 1, 1, 1723804684.9321265]
VI_at__the_End : ['1.201', '0.4847', '1.800', '0.1412', '1.800', '0.1177', '7.000', '0.7083', 1, 1, 1, 1, 1723804739.617842]