TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_36_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-019-08 | FUSED_ID : 6359364768380260664
  IC_TEMP :  -61.36 | VDDM : 1103.34 | AUX_INT :   -8.17 | CsaBias :   68.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.82679e-04 / 2
  ADC_P0  : -8.16595e-03 ± 2.11664e-02
  ADC_P1  : 8.54760e-03 ± 5.19317e-04
  ADC_P2  : -6.70993e-06 ± 2.52449e-06
  CSA_Chi2/NDF : 1.58216e-04 / 2
  CSA_P0  : 5.82912e-02 ± 8.38973e-03
  CSA_P1  : 1.00927e-02 ± 6.32106e-04
  CSA_P2  : -5.22296e-05 ± 9.62622e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [5, 8, 32, 42, 55, 57, 64, 65, 73, 78, 95, 97, 108, 109, 110, 115, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [0, 14, 27, 30, 31, 49, 53, 59, 61, 76, 85, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2915', '1.800', '0.1836', '1.800', '0.0940', '7.000', '0.7073', 1, 1, 1, 1, 1723804570.3879762]
VI_after__Init : ['1.202', '0.2917', '1.800', '0.1837', '1.801', '0.0881', '7.000', '0.7072', 1, 1, 1, 1, 1723804578.4584095]
VI_at__the_End : ['1.202', '0.4824', '1.800', '0.1402', '1.799', '0.1155', '7.000', '0.7080', 1, 1, 1, 1, 1723804633.8160777]