TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_34_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-020-08 | FUSED_ID : 6359364768380260680
  IC_TEMP :  -58.55 | VDDM : 1108.84 | AUX_INT :   -8.93 | CsaBias :   67.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59629e-03 / 2
  ADC_P0  : -8.93449e-03 ± 2.70803e-02
  ADC_P1  : 8.51127e-03 ± 6.66939e-04
  ADC_P2  : -6.17253e-06 ± 3.27046e-06
  CSA_Chi2/NDF : 1.33999e-04 / 2
  CSA_P0  : 6.16812e-02 ± 7.72099e-03
  CSA_P1  : 1.02428e-02 ± 5.81721e-04
  CSA_P2  : -5.36355e-05 ± 8.85892e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [46, 68, 74, 84, 85, 98, 105, 106, 121, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [15, 36, 43, 49, 52, 57, 71, 79, 85, 87, 91, 99, 107, 109, 110, 117, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4553', '1.800', '0.1598', '1.800', '0.0967', '7.000', '0.7074', 1, 1, 1, 1, 1723804464.1893144]
VI_after__Init : ['1.201', '0.4552', '1.800', '0.1597', '1.801', '0.0915', '7.000', '0.7075', 1, 1, 1, 1, 1723804471.4667637]
VI_at__the_End : ['1.202', '0.4906', '1.800', '0.1398', '1.799', '0.1136', '7.000', '0.7081', 1, 1, 1, 1, 1723804526.7573624]