TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_32_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-021-08 | FUSED_ID : 6359364768380260696
  IC_TEMP :  -55.58 | VDDM : 1130.53 | AUX_INT :   -5.39 | CsaBias :   76.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.18679e-04 / 2
  ADC_P0  : -5.38562e-03 ± 2.05528e-02
  ADC_P1  : 8.22321e-03 ± 5.09288e-04
  ADC_P2  : -4.93493e-06 ± 2.49503e-06
  CSA_Chi2/NDF : 1.22340e-04 / 2
  CSA_P0  : 5.97459e-02 ± 7.37747e-03
  CSA_P1  : 1.00621e-02 ± 5.55839e-04
  CSA_P2  : -4.84447e-05 ± 8.46477e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 7, 8, 11, 12, 40, 88, 105, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [8, 12, 27, 28, 29, 34, 44, 48, 61, 74, 85, 86, 92, 95, 107, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2967', '1.800', '0.1384', '1.800', '0.0921', '7.000', '0.7079', 1, 1, 1, 1, 1723804358.1845512]
VI_after__Init : ['1.202', '0.2967', '1.800', '0.1384', '1.800', '0.0848', '7.000', '0.7073', 1, 1, 1, 1, 1723804366.1058831]
VI_at__the_End : ['1.202', '0.4975', '1.800', '0.1381', '1.799', '0.1130', '7.000', '0.7082', 1, 1, 1, 1, 1723804420.2607164]