TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_30_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-022-08 | FUSED_ID : 6359364768380260712
  IC_TEMP :  -54.33 | VDDM : 1128.56 | AUX_INT :   -6.97 | CsaBias :   63.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.84277e-04 / 2
  ADC_P0  : -6.96967e-03 ± 2.11965e-02
  ADC_P1  : 8.85061e-03 ± 5.42431e-04
  ADC_P2  : -7.03008e-06 ± 2.74769e-06
  CSA_Chi2/NDF : 1.32321e-04 / 2
  CSA_P0  : 6.13176e-02 ± 7.67251e-03
  CSA_P1  : 1.01552e-02 ± 5.78068e-04
  CSA_P2  : -4.98160e-05 ± 8.80329e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [15, 19, 23, 25, 26, 42, 64, 66, 74, 75, 103, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [30, 38, 41, 42, 49, 71, 74, 81, 88, 89, 92, 95, 104, 107, 115, 116, 122, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3022', '1.800', '0.1304', '1.800', '0.0930', '7.000', '0.7080', 1, 1, 1, 1, 1723804251.5248132]
VI_after__Init : ['1.202', '0.3023', '1.800', '0.1304', '1.800', '0.0856', '7.000', '0.7074', 1, 1, 1, 1, 1723804259.7400978]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1410', '1.799', '0.1133', '7.000', '0.7081', 1, 1, 1, 1, 1723804316.4657638]