TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_29_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-023-08 | FUSED_ID : 6359364768380260728
  IC_TEMP :  -52.30 | VDDM : 1133.90 | AUX_INT :   -7.65 | CsaBias :   83.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03836e-03 / 2
  ADC_P0  : -7.65122e-03 ± 2.18176e-02
  ADC_P1  : 8.32882e-03 ± 5.34823e-04
  ADC_P2  : -5.67125e-06 ± 2.59601e-06
  CSA_Chi2/NDF : 1.26623e-04 / 2
  CSA_P0  : 5.96025e-02 ± 7.50549e-03
  CSA_P1  : 1.01069e-02 ± 5.65485e-04
  CSA_P2  : -4.84726e-05 ± 8.61167e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [0, 5, 7, 9, 24, 26, 30, 32, 41, 44, 54, 65, 66, 74, 82, 84, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [3, 18, 19, 20, 21, 39, 72, 88, 91, 96, 101, 112, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4071', '1.800', '0.1425', '1.800', '0.0943', '7.000', '0.7075', 1, 1, 1, 1, 1723804145.8958933]
VI_after__Init : ['1.202', '0.4073', '1.800', '0.1425', '1.801', '0.0884', '7.000', '0.7073', 1, 1, 1, 1, 1723804154.0153046]
VI_at__the_End : ['1.202', '0.4977', '1.800', '0.1360', '1.803', '0.1117', '7.000', '0.7079', 1, 1, 1, 1, 1723804209.0300415]