TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_27_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-024-08 | FUSED_ID : 6359364768380260744
  IC_TEMP :  -54.76 | VDDM : 1133.09 | AUX_INT :   -7.74 | CsaBias :   73.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22740e-03 / 2
  ADC_P0  : -7.74278e-03 ± 2.38149e-02
  ADC_P1  : 8.16695e-03 ± 5.89064e-04
  ADC_P2  : -4.35197e-06 ± 2.90051e-06
  CSA_Chi2/NDF : 1.73033e-04 / 2
  CSA_P0  : 6.05272e-02 ± 8.77379e-03
  CSA_P1  : 1.03479e-02 ± 6.61042e-04
  CSA_P2  : -5.26620e-05 ± 1.00669e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [10, 27, 28, 33, 36, 45, 51, 115, 118, 120, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 48, 59, 67, 78, 84, 101, 117, 118, 120, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1637', '1.800', '0.1640', '1.800', '0.0879', '7.000', '0.7072', 1, 1, 1, 1, 1723804039.3931634]
VI_after__Init : ['1.202', '0.1637', '1.800', '0.1640', '1.800', '0.0827', '7.000', '0.7072', 1, 1, 1, 1, 1723804047.373515]
VI_at__the_End : ['1.202', '0.4995', '1.800', '0.1401', '1.802', '0.1141', '7.000', '0.7082', 1, 1, 1, 1, 1723804103.526225]