TEST_NAME : Wafer
TEST_DATE : 24_08_16-12_22_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-009-027-08 | FUSED_ID : 6359364768380260792
  IC_TEMP :  -52.43 | VDDM : 1127.35 | AUX_INT :   -6.52 | CsaBias :   76.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00677e-03 / 2
  ADC_P0  : -6.52201e-03 ± 2.14832e-02
  ADC_P1  : 8.31826e-03 ± 5.26625e-04
  ADC_P2  : -5.64838e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 1.28111e-04 / 2
  CSA_P0  : 5.75373e-02 ± 7.54944e-03
  CSA_P1  : 1.00019e-02 ± 5.68796e-04
  CSA_P2  : -4.68813e-05 ± 8.66209e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [5, 12, 14, 24, 28, 29, 35, 55, 74, 75, 84, 89, 91, 98, 100, 106, 115, 117, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [5, 18, 26, 28, 34, 43, 46, 49, 57, 58, 87, 96, 102, 121]
 | P_BROKEN_SLOW :  [37]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1394', '1.800', '0.1006', '1.799', '0.0840', '7.000', '0.7082', 1, 1, 1, 1, 1723803720.559648]
VI_after__Init : ['1.202', '0.1393', '1.800', '0.1006', '1.800', '0.0772', '7.000', '0.7075', 1, 1, 1, 1, 1723803727.9470208]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1327', '1.803', '0.1122', '7.000', '0.7082', 1, 1, 1, 1, 1723803784.7396939]