TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_11_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-004-01 | FUSED_ID : 6359364768380264513
  IC_TEMP :  -72.55 | VDDM : 1113.41 | AUX_INT :  -10.44 | CsaBias :   57.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83921e-03 / 2
  ADC_P0  : -1.04392e-02 ± 2.91205e-02
  ADC_P1  : 8.53816e-03 ± 7.26000e-04
  ADC_P2  : -5.75713e-06 ± 3.61448e-06
  CSA_Chi2/NDF : 1.75350e-04 / 2
  CSA_P0  : 5.66228e-02 ± 8.83234e-03
  CSA_P1  : 1.02402e-02 ± 6.65453e-04
  CSA_P2  : -6.20034e-05 ± 1.01341e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [8, 27, 28, 38, 42, 61, 70, 78, 89, 92, 96, 105, 122, 124, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [9, 17, 27, 30, 40, 44, 45, 55, 63, 68, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2771', '1.800', '0.1515', '1.800', '0.0959', '7.000', '0.7073', 1, 1, 1, 1, 1723806688.1509483]
VI_after__Init : ['1.202', '0.2773', '1.800', '0.1517', '1.800', '0.0898', '7.000', '0.7072', 1, 1, 1, 1, 1723806696.1553571]
VI_at__the_End : ['1.202', '0.4511', '1.800', '0.1345', '1.800', '0.1174', '7.000', '0.7079', 1, 1, 1, 1, 1723806751.4961514]