TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_18_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-008-01 | FUSED_ID : 6359364768380264577
  IC_TEMP :  -65.46 | VDDM : 1121.80 | AUX_INT :   -9.95 | CsaBias :   66.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62233e-03 / 2
  ADC_P0  : -9.95162e-03 ± 2.73003e-02
  ADC_P1  : 8.51668e-03 ± 6.72357e-04
  ADC_P2  : -6.18127e-06 ± 3.29702e-06
  CSA_Chi2/NDF : 1.56628e-04 / 2
  CSA_P0  : 5.66155e-02 ± 8.34751e-03
  CSA_P1  : 1.05425e-02 ± 6.28925e-04
  CSA_P2  : -6.26817e-05 ± 9.57778e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [25, 39, 49, 55, 56, 65, 79, 100, 107, 115, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [46, 50, 74, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3675', '1.800', '0.1457', '1.800', '0.0389', '7.000', '0.7055', 1, 1, 1, 1, 1723807107.9868283]
VI_after__Init : ['1.201', '0.3681', '1.800', '0.1460', '1.800', '0.0906', '7.000', '0.7073', 1, 1, 1, 1, 1723807116.1521797]
VI_at__the_End : ['1.202', '0.4677', '1.800', '0.1369', '1.800', '0.1176', '7.000', '0.7081', 1, 1, 1, 1, 1723807171.6202755]