TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_20_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-009-01 | FUSED_ID : 6359364768380264593
  IC_TEMP :  -65.44 | VDDM : 1108.25 | AUX_INT :  -10.47 | CsaBias :   71.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.07139e-03 / 2
  ADC_P0  : -1.04662e-02 ± 3.09075e-02
  ADC_P1  : 8.29235e-03 ± 7.41371e-04
  ADC_P2  : -5.85167e-06 ± 3.53818e-06
  CSA_Chi2/NDF : 1.26135e-04 / 2
  CSA_P0  : 5.71985e-02 ± 7.49101e-03
  CSA_P1  : 9.57868e-03 ± 5.64394e-04
  CSA_P2  : -5.18209e-05 ± 8.59505e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [1, 8, 18, 23, 36, 40, 68, 71, 92, 95, 105, 118, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 5, 22, 23, 25, 41, 51, 59, 68, 87, 111, 117, 119, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2117', '1.800', '0.1464', '1.800', '0.0952', '7.000', '0.7081', 1, 1, 1, 1, 1723807214.815148]
VI_after__Init : ['1.202', '0.2121', '1.800', '0.1455', '1.800', '0.0880', '7.000', '0.7075', 1, 1, 1, 1, 1723807222.9335885]
VI_at__the_End : ['1.202', '0.4511', '1.800', '0.1338', '1.802', '0.1169', '7.000', '0.7079', 1, 1, 1, 1, 1723807277.7086442]