TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_23_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-011-01 | FUSED_ID : 6359364768380264625
  IC_TEMP :  -63.99 | VDDM : 1122.64 | AUX_INT :   -9.04 | CsaBias :   59.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21739e-03 / 2
  ADC_P0  : -9.04250e-03 ± 2.35772e-02
  ADC_P1  : 8.62934e-03 ± 5.80464e-04
  ADC_P2  : -6.94056e-06 ± 2.83478e-06
  CSA_Chi2/NDF : 1.50829e-04 / 2
  CSA_P0  : 5.97216e-02 ± 8.19154e-03
  CSA_P1  : 1.00978e-02 ± 6.17173e-04
  CSA_P2  : -5.50853e-05 ± 9.39882e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [6, 18, 20, 28, 29, 36, 42, 54, 60, 69, 80, 81, 83, 85, 86, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 19, 24, 25, 47, 52, 59, 73, 81, 98, 112, 113, 116, 120, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2876', '1.800', '0.1609', '1.800', '0.0951', '7.000', '0.7075', 1, 1, 1, 1, 1723807427.5648253]
VI_after__Init : ['1.202', '0.2876', '1.800', '0.1610', '1.799', '0.0902', '7.000', '0.7075', 1, 1, 1, 1, 1723807434.9062352]
VI_at__the_End : ['1.202', '0.4730', '1.800', '0.1369', '1.800', '0.1145', '7.000', '0.7079', 1, 1, 1, 1, 1723807490.523205]