TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_25_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-012-01 | FUSED_ID : 6359364768380264641
  IC_TEMP :  -61.06 | VDDM : 1128.39 | AUX_INT :  -10.14 | CsaBias :   70.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55141e-03 / 2
  ADC_P0  : -1.01356e-02 ± 2.66720e-02
  ADC_P1  : 9.00777e-03 ± 6.92112e-04
  ADC_P2  : -6.97188e-06 ± 3.58184e-06
  CSA_Chi2/NDF : 1.66099e-04 / 2
  CSA_P0  : 6.20931e-02 ± 8.59619e-03
  CSA_P1  : 1.07018e-02 ± 6.47661e-04
  CSA_P2  : -6.17959e-05 ± 9.86311e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 10, 35, 40, 41, 56, 94, 112, 115, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [18, 35, 38, 45, 47, 58, 72, 83, 87, 89, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2885', '1.800', '0.1377', '1.799', '0.0898', '7.000', '0.7073', 1, 1, 1, 1, 1723807534.0090063]
VI_after__Init : ['1.202', '0.2885', '1.800', '0.1377', '1.800', '0.0849', '7.000', '0.7074', 1, 1, 1, 1, 1723807541.416429]
VI_at__the_End : ['1.202', '0.4861', '1.800', '0.1420', '1.800', '0.1143', '7.000', '0.7079', 1, 1, 1, 1, 1723807596.6303535]