TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_27_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-013-01 | FUSED_ID : 6359364768380264657
  IC_TEMP :  -62.91 | VDDM : 1122.94 | AUX_INT :   -9.41 | CsaBias :   60.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45958e-03 / 2
  ADC_P0  : -9.41095e-03 ± 2.58650e-02
  ADC_P1  : 8.81898e-03 ± 6.56224e-04
  ADC_P2  : -6.96301e-06 ± 3.30265e-06
  CSA_Chi2/NDF : 1.55199e-04 / 2
  CSA_P0  : 5.83540e-02 ± 8.30935e-03
  CSA_P1  : 1.05596e-02 ± 6.26050e-04
  CSA_P2  : -6.08689e-05 ± 9.53399e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [25, 30, 56, 58, 64, 78, 87, 94, 102, 104, 118, 121, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [16, 25, 37, 45, 51, 52, 57, 65, 75, 82, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4868', '1.800', '0.1798', '1.800', '0.1048', '7.000', '0.7080', 1, 1, 1, 1, 1723807640.527113]
VI_after__Init : ['1.202', '0.4886', '1.800', '0.1800', '1.799', '0.0970', '7.000', '0.7072', 1, 1, 1, 1, 1723807648.433574]
VI_at__the_End : ['1.202', '0.4768', '1.800', '0.1385', '1.800', '0.1160', '7.000', '0.7079', 1, 1, 1, 1, 1723807703.6885045]