TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_29_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-014-01 | FUSED_ID : 6359364768380264673
  IC_TEMP :  -56.43 | VDDM : 1120.56 | AUX_INT :   -8.62 | CsaBias :   67.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25515e-03 / 2
  ADC_P0  : -8.62220e-03 ± 2.40292e-02
  ADC_P1  : 8.52755e-03 ± 6.07570e-04
  ADC_P2  : -5.43451e-06 ± 3.05897e-06
  CSA_Chi2/NDF : 1.43688e-04 / 2
  CSA_P0  : 6.15988e-02 ± 7.99526e-03
  CSA_P1  : 1.05457e-02 ± 6.02385e-04
  CSA_P2  : -5.97184e-05 ± 9.17361e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [12, 26, 34, 37, 44, 54, 73, 92, 101, 102, 104, 106, 108, 109, 110, 124, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 19, 38, 47, 63, 65, 97, 102, 108, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3980', '1.800', '0.1509', '1.800', '0.1003', '7.000', '0.7071', 1, 1, 1, 1, 1723807747.5292203]
VI_after__Init : ['1.202', '0.3983', '1.800', '0.1510', '1.800', '0.0947', '7.000', '0.7073', 1, 1, 1, 1, 1723807755.5196617]
VI_at__the_End : ['1.202', '0.4851', '1.800', '0.1386', '1.800', '0.1146', '7.000', '0.7079', 1, 1, 1, 1, 1723807810.9905112]