TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_30_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-015-01 | FUSED_ID : 6359364768380264689
  IC_TEMP :  -58.81 | VDDM : 1126.02 | AUX_INT :   -8.22 | CsaBias :   61.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32373e-03 / 2
  ADC_P0  : -8.22268e-03 ± 2.46707e-02
  ADC_P1  : 8.71706e-03 ± 6.32958e-04
  ADC_P2  : -6.17040e-06 ± 3.21659e-06
  CSA_Chi2/NDF : 1.59044e-04 / 2
  CSA_P0  : 5.92734e-02 ± 8.41164e-03
  CSA_P1  : 1.02509e-02 ± 6.33757e-04
  CSA_P2  : -5.72967e-05 ± 9.65136e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [5, 24, 31, 35, 40, 53, 68, 76, 88, 96, 106, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 6, 17, 27, 34, 46, 48, 57, 65, 77, 79, 86, 101, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3475', '1.800', '0.1982', '1.800', '0.0922', '7.000', '0.7072', 1, 1, 1, 1, 1723807853.217349]
VI_after__Init : ['1.202', '0.3473', '1.800', '0.1984', '1.800', '0.0864', '7.000', '0.7072', 1, 1, 1, 1, 1723807861.2867575]
VI_at__the_End : ['1.202', '0.4750', '1.800', '0.1386', '1.800', '0.1147', '7.000', '0.7078', 1, 1, 1, 1, 1723807915.783729]