TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_32_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-016-06 | FUSED_ID : 6359364768380264710
  IC_TEMP :  -56.61 | VDDM : 1124.06 | AUX_INT :   -8.46 | CsaBias :   68.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13122e-03 / 2
  ADC_P0  : -8.45689e-03 ± 2.27450e-02
  ADC_P1  : 8.58120e-03 ± 5.63052e-04
  ADC_P2  : -6.58012e-06 ± 2.76285e-06
  CSA_Chi2/NDF : 1.13120e-04 / 2
  CSA_P0  : 5.96777e-02 ± 7.09401e-03
  CSA_P1  : 1.00320e-02 ± 5.34483e-04
  CSA_P2  : -5.13538e-05 ± 8.13954e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [4, 12, 15, 18, 21, 22, 48, 58, 61, 62, 65, 72, 74, 75, 84, 100, 108, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [5, 17, 20, 29, 43, 61, 65, 75, 78, 95, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3015', '1.800', '0.1686', '1.800', '0.0933', '7.000', '0.7080', 1, 1, 1, 1, 1723807959.5584056]
VI_after__Init : ['1.202', '0.3017', '1.800', '0.1686', '1.800', '0.0850', '7.000', '0.7071', 1, 1, 1, 1, 1723807967.545833]
VI_at__the_End : ['1.202', '0.4829', '1.800', '0.1379', '1.800', '0.1125', '7.000', '0.7079', 1, 1, 1, 1, 1723808023.4746735]