TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_46_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-024-06 | FUSED_ID : 6359364768380264838
  IC_TEMP :  -57.76 | VDDM : 1128.93 | AUX_INT :   -8.25 | CsaBias :   69.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02165e-03 / 2
  ADC_P0  : -8.24521e-03 ± 2.15884e-02
  ADC_P1  : 8.69898e-03 ± 5.40828e-04
  ADC_P2  : -6.86054e-06 ± 2.68319e-06
  CSA_Chi2/NDF : 1.65411e-04 / 2
  CSA_P0  : 6.03213e-02 ± 8.57838e-03
  CSA_P1  : 1.03337e-02 ± 6.46319e-04
  CSA_P2  : -5.28881e-05 ± 9.84267e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [4, 6, 12, 23, 24, 32, 76, 90, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [2, 25, 28, 32, 51, 79, 93, 97, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3722', '1.800', '0.1575', '1.800', '0.0947', '7.000', '0.7080', 1, 1, 1, 1, 1723808804.7619514]
VI_after__Init : ['1.201', '0.3724', '1.800', '0.1575', '1.800', '0.0877', '7.000', '0.7072', 1, 1, 1, 1, 1723808812.7903502]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1385', '1.802', '0.1156', '7.000', '0.7078', 1, 1, 1, 1, 1723808867.3832407]