TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_48_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-010-025-06 | FUSED_ID : 6359364768380264854
  IC_TEMP :  -51.60 | VDDM : 1127.38 | AUX_INT :  -26.68 | CsaBias :   58.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69944e-03 / 2
  ADC_P0  : -2.66776e-02 ± 2.89447e-02
  ADC_P1  : 8.58650e-03 ± 6.96759e-04
  ADC_P2  : -6.53976e-06 ± 3.33770e-06
  CSA_Chi2/NDF : 1.39347e-04 / 2
  CSA_P0  : 5.83741e-02 ± 7.87357e-03
  CSA_P1  : 1.00329e-02 ± 5.93217e-04
  CSA_P2  : -4.80218e-05 ± 9.03399e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [7, 19, 22, 27, 32, 39, 47, 54, 66, 67, 72, 86, 106, 108, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [3, 19, 20, 21, 52, 54, 55, 59, 68, 78, 87, 93, 100, 102, 107, 108, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2553', '1.800', '0.1564', '1.799', '0.0898', '7.000', '0.7079', 1, 1, 1, 1, 1723808910.6629527]
VI_after__Init : ['1.202', '0.2553', '1.800', '0.1564', '1.801', '0.0822', '7.000', '0.7073', 1, 1, 1, 1, 1723808918.7794032]
VI_at__the_End : ['1.202', '0.4937', '1.800', '0.1344', '1.803', '0.1130', '7.000', '0.7081', 1, 1, 1, 1, 1723808974.2182117]