TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_38_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-011-002-12 | FUSED_ID : 6359364768380268588
  IC_TEMP :  -77.04 | VDDM : 1119.56 | AUX_INT :  -10.78 | CsaBias :   53.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69580e-03 / 2
  ADC_P0  : -1.07799e-02 ± 2.78730e-02
  ADC_P1  : 9.24539e-03 ± 7.35059e-04
  ADC_P2  : -7.64158e-06 ± 3.86762e-06
  CSA_Chi2/NDF : 1.92812e-04 / 2
  CSA_P0  : 5.92999e-02 ± 9.26167e-03
  CSA_P1  : 1.07881e-02 ± 6.97800e-04
  CSA_P2  : -6.95886e-05 ± 1.06267e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [0, 3, 17, 20, 25, 37, 80, 87, 93, 96, 97, 99, 110, 119, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [7, 18, 24, 28, 51, 58, 70, 71, 75, 97, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2042', '1.800', '0.1565', '1.799', '0.0399', '7.000', '0.7056', 1, 1, 1, 1, 1723811880.9549696]
VI_after__Init : ['1.202', '0.2044', '1.800', '0.1565', '1.800', '0.0904', '7.000', '0.7075', 1, 1, 1, 1, 1723811888.9393713]
VI_at__the_End : ['1.201', '0.4562', '1.800', '0.1394', '1.802', '0.1178', '7.000', '0.7084', 1, 1, 1, 1, 1723811945.2401483]