TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_34_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-011-004-12 | FUSED_ID : 6359364768380268620
  IC_TEMP :  -67.92 | VDDM : 1120.32 | AUX_INT :   -9.13 | CsaBias :   73.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48447e-03 / 2
  ADC_P0  : -9.12685e-03 ± 2.61168e-02
  ADC_P1  : 8.33807e-03 ± 6.31549e-04
  ADC_P2  : -5.97044e-06 ± 3.03254e-06
  CSA_Chi2/NDF : 1.98747e-04 / 2
  CSA_P0  : 5.75715e-02 ± 9.40313e-03
  CSA_P1  : 9.82471e-03 ± 7.08458e-04
  CSA_P2  : -5.29838e-05 ± 1.07890e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 25, 48, 64, 72, 78, 102, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [7, 11, 22, 29, 37, 63, 65, 67, 78, 90, 94, 96, 119, 120, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1375', '1.800', '0.1763', '1.800', '0.0878', '7.000', '0.7077', 1, 1, 1, 1, 1723811672.674855]
VI_after__Init : ['1.201', '0.1375', '1.800', '0.1763', '1.801', '0.0821', '7.000', '0.7076', 1, 1, 1, 1, 1723811680.681252]
VI_at__the_End : ['1.201', '0.4613', '1.800', '0.1352', '1.799', '0.1166', '7.000', '0.7082', 1, 1, 1, 1, 1723811737.0720117]