TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_31_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-011-006-12 | FUSED_ID : 6359364768380268652
  IC_TEMP :  -63.66 | VDDM : 1118.49 | AUX_INT :  -11.69 | CsaBias :   72.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.39422e-03 / 2
  ADC_P0  : -1.16896e-02 ± 3.32956e-02
  ADC_P1  : 8.47948e-03 ± 8.25875e-04
  ADC_P2  : -5.38206e-06 ± 4.10930e-06
  CSA_Chi2/NDF : 1.58963e-04 / 2
  CSA_P0  : 5.74752e-02 ± 8.40950e-03
  CSA_P1  : 1.01937e-02 ± 6.33595e-04
  CSA_P2  : -5.94956e-05 ± 9.64891e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [12, 20, 21, 31, 35, 64, 72, 76, 93, 98, 99, 102, 103, 107, 109, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [15, 18, 28, 30, 42, 87, 90, 93, 100, 102, 110, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2388', '1.800', '0.1229', '1.800', '0.0874', '7.000', '0.7076', 1, 1, 1, 1, 1723811460.9379132]
VI_after__Init : ['1.202', '0.2389', '1.800', '0.1229', '1.800', '0.0820', '7.000', '0.7073', 1, 1, 1, 1, 1723811468.9422908]
VI_at__the_End : ['1.201', '0.4591', '1.800', '0.1376', '1.804', '0.1157', '7.000', '0.7080', 1, 1, 1, 1, 1723811524.5770838]