TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_29_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-011-007-12 | FUSED_ID : 6359364768380268668
  IC_TEMP :  -78.11 | VDDM : 1105.74 | AUX_INT :  -11.37 | CsaBias :   48.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.99167e-03 / 2
  ADC_P0  : -1.13719e-02 ± 3.02998e-02
  ADC_P1  : 8.56260e-03 ± 7.56187e-04
  ADC_P2  : -5.58932e-06 ± 3.78981e-06
  CSA_Chi2/NDF : 1.92065e-04 / 2
  CSA_P0  : 6.00630e-02 ± 9.24371e-03
  CSA_P1  : 1.06016e-02 ± 6.96447e-04
  CSA_P2  : -7.09338e-05 ± 1.06061e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [11, 14, 32, 38, 46, 47, 51, 57, 68, 94, 99, 108, 112, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 9, 30, 39, 45, 47, 82, 83, 84, 94, 105, 107, 118, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2693', '1.800', '0.1401', '1.799', '0.0900', '7.000', '0.7073', 1, 1, 1, 1, 1723811354.2148433]
VI_after__Init : ['1.202', '0.2694', '1.800', '0.1401', '1.799', '0.0842', '7.000', '0.7075', 1, 1, 1, 1, 1723811362.214262]
VI_at__the_End : ['1.201', '0.4421', '1.800', '0.1372', '1.800', '0.1159', '7.000', '0.7081', 1, 1, 1, 1, 1723811419.9209433]