TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_23_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-011-010-12 | FUSED_ID : 6359364768380268716
  IC_TEMP :  -61.82 | VDDM : 1125.54 | AUX_INT :  -11.05 | CsaBias :   65.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95129e-03 / 2
  ADC_P0  : -1.10523e-02 ± 2.99722e-02
  ADC_P1  : 8.58969e-03 ± 7.43130e-04
  ADC_P2  : -6.14869e-06 ± 3.68198e-06
  CSA_Chi2/NDF : 1.65355e-04 / 2
  CSA_P0  : 5.90470e-02 ± 8.57691e-03
  CSA_P1  : 1.03432e-02 ± 6.46208e-04
  CSA_P2  : -5.90371e-05 ± 9.84099e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  20
 | N_BROKEN_FAST :  [0, 5, 7, 9, 11, 13, 18, 25, 29, 37, 41, 50, 54, 58, 79, 108, 112, 116, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 36, 39, 69, 78, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2110', '1.800', '0.1572', '1.800', '0.0863', '7.000', '0.7075', 1, 1, 1, 1, 1723811035.9225192]
VI_after__Init : ['1.202', '0.2112', '1.800', '0.1570', '1.800', '0.0805', '7.000', '0.7076', 1, 1, 1, 1, 1723811043.9009323]
VI_at__the_End : ['1.202', '0.4725', '1.800', '0.1356', '1.799', '0.1164', '7.000', '0.7082', 1, 1, 1, 1, 1723811099.1886544]