TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_15_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-011-015-12 | FUSED_ID : 6359364768380268796
  IC_TEMP :  -57.77 | VDDM : 1127.31 | AUX_INT :   -7.30 | CsaBias :   82.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34608e-03 / 2
  ADC_P0  : -7.29891e-03 ± 2.49141e-02
  ADC_P1  : 8.21739e-03 ± 6.10889e-04
  ADC_P2  : -4.95315e-06 ± 2.97713e-06
  CSA_Chi2/NDF : 1.42876e-04 / 2
  CSA_P0  : 5.80373e-02 ± 7.97263e-03
  CSA_P1  : 9.86802e-03 ± 6.00680e-04
  CSA_P2  : -5.09998e-05 ± 9.14764e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  23
 | N_BROKEN_FAST :  [9, 26, 28, 34, 35, 40, 47, 48, 49, 50, 58, 59, 63, 74, 76, 100, 105, 108, 116, 117, 119, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [21, 40, 49, 53, 75, 80, 85, 97, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2655', '1.800', '0.1749', '1.800', '0.0898', '7.000', '0.7073', 1, 1, 1, 1, 1723810502.8854196]
VI_after__Init : ['1.202', '0.2653', '1.800', '0.1749', '1.802', '0.0840', '7.000', '0.7076', 1, 1, 1, 1, 1723810510.829807]
VI_at__the_End : ['1.202', '0.4724', '1.800', '0.1362', '1.802', '0.1155', '7.000', '0.7079', 1, 1, 1, 1, 1723810566.3934376]