TEST_NAME : Wafer
TEST_DATE : 24_08_16-13_53_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-011-027-11 | FUSED_ID : 6359364768380268987
  IC_TEMP :  -50.50 | VDDM : 1122.96 | AUX_INT :   -5.36 | CsaBias :   75.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.83818e-04 / 2
  ADC_P0  : -5.36201e-03 ± 1.63472e-02
  ADC_P1  : 8.12691e-03 ± 4.00203e-04
  ADC_P2  : -4.91666e-06 ± 1.93362e-06
  CSA_Chi2/NDF : 1.28061e-04 / 2
  CSA_P0  : 5.80206e-02 ± 7.54799e-03
  CSA_P1  : 9.64354e-03 ± 5.68687e-04
  CSA_P2  : -4.21720e-05 ± 8.66042e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [0, 5, 25, 37, 45, 46, 48, 50, 70, 74, 76, 97, 113, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [15, 21, 27, 33, 38, 41, 42, 44, 65, 68, 73, 76, 105, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4537', '1.800', '0.1526', '1.799', '0.1011', '7.000', '0.7072', 1, 1, 1, 1, 1723809230.9031284]
VI_after__Init : ['1.202', '0.4535', '1.800', '0.1527', '1.801', '0.0953', '7.000', '0.7072', 1, 1, 1, 1, 1723809238.8414605]
VI_at__the_End : ['1.202', '0.4942', '1.800', '0.1352', '1.803', '0.1114', '7.000', '0.7081', 1, 1, 1, 1, 1723809295.5605397]