TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_39_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-012-002-04 | FUSED_ID : 6359364768380272676
  IC_TEMP :  -69.02 | VDDM : 1099.06 | AUX_INT :  -10.01 | CsaBias :   62.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55024e-03 / 2
  ADC_P0  : -1.00134e-02 ± 2.66717e-02
  ADC_P1  : 9.18167e-03 ± 7.07542e-04
  ADC_P2  : -7.15777e-06 ± 3.74209e-06
  CSA_Chi2/NDF : 1.88025e-04 / 2
  CSA_P0  : 5.82867e-02 ± 9.14598e-03
  CSA_P1  : 1.04773e-02 ± 6.89084e-04
  CSA_P2  : -6.28385e-05 ± 1.04939e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 9, 16, 33, 48, 64, 65, 68, 70, 76, 77, 98, 110, 113, 114, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [10, 42, 43, 58, 69, 77, 86, 89, 95, 103, 104, 110, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1811', '1.800', '0.1968', '1.799', '0.0900', '7.000', '0.7084', 1, 1, 1, 1, 1723811986.9738584]
VI_after__Init : ['1.202', '0.1812', '1.800', '0.1968', '1.800', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1723811995.0952861]
VI_at__the_End : ['1.201', '0.4641', '1.800', '0.1398', '1.800', '0.1171', '7.000', '0.7082', 1, 1, 1, 1, 1723812051.417923]