TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_46_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-012-006-04 | FUSED_ID : 6359364768380272740
  IC_TEMP :  -62.52 | VDDM : 1111.39 | AUX_INT :   -8.76 | CsaBias :   65.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26340e-03 / 2
  ADC_P0  : -8.76326e-03 ± 2.40832e-02
  ADC_P1  : 8.24736e-03 ± 5.82247e-04
  ADC_P2  : -5.49091e-06 ± 2.79844e-06
  CSA_Chi2/NDF : 1.77096e-04 / 2
  CSA_P0  : 5.91720e-02 ± 8.87619e-03
  CSA_P1  : 1.02501e-02 ± 6.68757e-04
  CSA_P2  : -5.68011e-05 ± 1.01844e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [37, 49, 78, 82, 89, 93, 94, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [3, 13, 14, 35, 43, 50, 56, 61, 69, 73, 82, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2774', '1.800', '0.1165', '1.799', '0.0906', '7.000', '0.7085', 1, 1, 1, 1, 1723812412.2081618]
VI_after__Init : ['1.201', '0.2778', '1.800', '0.1165', '1.800', '0.0830', '7.000', '0.7076', 1, 1, 1, 1, 1723812420.1935294]
VI_at__the_End : ['1.202', '0.4748', '1.800', '0.1385', '1.804', '0.1158', '7.000', '0.7082', 1, 1, 1, 1, 1723812475.7333262]