TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_48_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-012-007-04 | FUSED_ID : 6359364768380272756
  IC_TEMP :  -57.24 | VDDM : 1124.45 | AUX_INT :   -9.48 | CsaBias :   71.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61951e-03 / 2
  ADC_P0  : -9.47720e-03 ± 2.73450e-02
  ADC_P1  : 8.14639e-03 ± 6.61325e-04
  ADC_P2  : -4.80472e-06 ± 3.19132e-06
  CSA_Chi2/NDF : 1.32512e-04 / 2
  CSA_P0  : 5.66425e-02 ± 7.67803e-03
  CSA_P1  : 9.74065e-03 ± 5.78484e-04
  CSA_P2  : -4.99770e-05 ± 8.80963e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 11, 19, 43, 47, 50, 55, 57, 62, 73, 83, 85, 87, 95, 107, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [7, 16, 24, 41, 60, 61, 79, 89, 108, 112, 120, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2677', '1.800', '0.1530', '1.799', '0.0864', '7.000', '0.7076', 1, 1, 1, 1, 1723812518.5189483]
VI_after__Init : ['1.202', '0.2677', '1.800', '0.1530', '1.800', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1723812526.5473356]
VI_at__the_End : ['1.201', '0.4679', '1.800', '0.1330', '1.803', '0.1160', '7.000', '0.7082', 1, 1, 1, 1, 1723812582.7441785]