TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_50_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-012-008-04 | FUSED_ID : 6359364768380272772
  IC_TEMP :  -70.40 | VDDM : 1111.66 | AUX_INT :  -10.10 | CsaBias :   58.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64111e-03 / 2
  ADC_P0  : -1.01001e-02 ± 2.74765e-02
  ADC_P1  : 8.66347e-03 ± 6.93277e-04
  ADC_P2  : -6.06568e-06 ± 3.49027e-06
  CSA_Chi2/NDF : 1.77032e-04 / 2
  CSA_P0  : 5.88430e-02 ± 8.87459e-03
  CSA_P1  : 1.04962e-02 ± 6.68636e-04
  CSA_P2  : -6.42815e-05 ± 1.01825e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [2, 7, 31, 33, 38, 41, 50, 54, 66, 79, 84, 89, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [2, 23, 27, 28, 43, 47, 59, 65, 80, 84, 87, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2968', '1.800', '0.1434', '1.800', '0.0926', '7.000', '0.7073', 1, 1, 1, 1, 1723812624.5687826]
VI_after__Init : ['1.202', '0.2973', '1.800', '0.1435', '1.800', '0.0868', '7.000', '0.7076', 1, 1, 1, 1, 1723812632.616153]
VI_at__the_End : ['1.202', '0.4596', '1.800', '0.1391', '1.807', '0.1184', '7.000', '0.7080', 1, 1, 1, 1, 1723812689.4947505]