TEST_NAME : Wafer
TEST_DATE : 24_08_16-14_55_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-012-011-04 | FUSED_ID : 6359364768380272820
  IC_TEMP :  -59.39 | VDDM : 1129.20 | AUX_INT :   -9.22 | CsaBias :   66.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35287e-03 / 2
  ADC_P0  : -9.22262e-03 ± 2.49113e-02
  ADC_P1  : 8.44208e-03 ± 6.11407e-04
  ADC_P2  : -5.97942e-06 ± 2.98423e-06
  CSA_Chi2/NDF : 1.52149e-04 / 2
  CSA_P0  : 6.10714e-02 ± 8.22730e-03
  CSA_P1  : 1.00856e-02 ± 6.19867e-04
  CSA_P2  : -5.35900e-05 ± 9.43985e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 11, 13, 22, 23, 44, 51, 56, 76, 89, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 25, 33, 34, 36, 63, 75, 101, 102, 106, 107, 112, 116, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4270', '1.800', '0.1686', '1.799', '0.1019', '7.000', '0.7081', 1, 1, 1, 1, 1723812944.0680718]
VI_after__Init : ['1.202', '0.4281', '1.800', '0.1696', '1.800', '0.0940', '7.000', '0.7073', 1, 1, 1, 1, 1723812952.0054557]
VI_at__the_End : ['1.201', '0.4785', '1.800', '0.1399', '1.804', '0.1148', '7.000', '0.7083', 1, 1, 1, 1, 1723813007.2242086]