TEST_NAME : Wafer
TEST_DATE : 24_08_19-07_58_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-012-027-03 | FUSED_ID : 6359364768380273075
  IC_TEMP :  -62.89 | VDDM : 1072.23 | AUX_INT :  -22.18 | CsaBias :   72.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.87098e-03 / 2
  ADC_P0  : -2.21777e-02 ± 6.38866e-02
  ADC_P1  : 9.56434e-03 ± 1.58518e-03
  ADC_P2  : -1.46599e-05 ± 7.81037e-06
  CSA_Chi2/NDF : 1.45980e-04 / 2
  CSA_P0  : 5.91929e-02 ± 8.05877e-03
  CSA_P1  : 1.01458e-02 ± 6.07170e-04
  CSA_P2  : -5.03177e-05 ± 9.24648e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 12, 22, 51, 52, 58, 87, 100, 102, 103, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 7, 30, 31, 39, 69, 85, 93, 96, 105, 112, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1270', '1.800', '0.1456', '1.799', '0.0798', '7.000', '0.7076', 1, 1, 1, 1, 1724047122.1067343]
VI_after__Init : ['1.201', '0.1270', '1.800', '0.1453', '1.800', '0.0751', '7.000', '0.7079', 1, 1, 1, 1, 1724047129.6590436]
VI_at__the_End : ['1.198', '0.4938', '1.800', '0.1366', '1.806', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1724047183.1535907]