TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_04_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-006-02 | FUSED_ID : 6359364768380289122
  IC_TEMP :  -66.82 | VDDM : 1120.49 | AUX_INT :   -8.83 | CsaBias :   69.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32437e-03 / 2
  ADC_P0  : -8.83282e-03 ± 2.46651e-02
  ADC_P1  : 8.74211e-03 ± 6.31397e-04
  ADC_P2  : -6.24707e-06 ± 3.21183e-06
  CSA_Chi2/NDF : 2.02357e-04 / 2
  CSA_P0  : 5.83450e-02 ± 9.48816e-03
  CSA_P1  : 1.00841e-02 ± 7.14864e-04
  CSA_P2  : -5.49846e-05 ± 1.08865e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [14, 16, 20, 26, 41, 43, 48, 49, 69, 76, 84, 96, 103, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 10, 14, 28, 29, 37, 47, 58, 60, 68, 86, 91, 102, 104, 113, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2214', '1.800', '0.1420', '1.799', '0.0877', '7.000', '0.7065', 1, 1, 1, 1, 1724054656.3183453]
VI_after__Init : ['1.201', '0.2216', '1.800', '0.1422', '1.801', '0.0820', '7.000', '0.7066', 1, 1, 1, 1, 1724054664.3927515]
VI_at__the_End : ['1.201', '0.4693', '1.800', '0.1348', '1.799', '0.1153', '7.000', '0.7072', 1, 1, 1, 1, 1724054719.9005167]