TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_13_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-011-02 | FUSED_ID : 6359364768380289202
  IC_TEMP :  -58.02 | VDDM : 1133.20 | AUX_INT :   -6.47 | CsaBias :   66.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.86987e-04 / 2
  ADC_P0  : -6.46658e-03 ± 2.12892e-02
  ADC_P1  : 8.10483e-03 ± 5.15121e-04
  ADC_P2  : -5.12351e-06 ± 2.45984e-06
  CSA_Chi2/NDF : 1.56088e-04 / 2
  CSA_P0  : 5.75870e-02 ± 8.33311e-03
  CSA_P1  : 9.87939e-03 ± 6.27840e-04
  CSA_P2  : -4.93258e-05 ± 9.56125e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [5, 9, 25, 26, 32, 50, 69, 70, 73, 74, 84, 85, 110, 116, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [17, 41, 42, 53, 58, 67, 70, 74, 78, 113, 116, 121, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1375', '1.800', '0.1320', '1.799', '0.0802', '7.000', '0.7067', 1, 1, 1, 1, 1724055182.6153994]
VI_after__Init : ['1.201', '0.1376', '1.800', '0.1318', '1.800', '0.0745', '7.000', '0.7069', 1, 1, 1, 1, 1724055190.5707762]
VI_at__the_End : ['1.201', '0.4814', '1.800', '0.1335', '1.803', '0.1111', '7.000', '0.7076', 1, 1, 1, 1, 1724055246.6626294]