TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_16_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-013-02 | FUSED_ID : 6359364768380289234
  IC_TEMP :  -56.23 | VDDM : 1119.70 | AUX_INT :  -26.99 | CsaBias :   56.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.84802e-03 / 2
  ADC_P0  : -2.69851e-02 ± 3.02214e-02
  ADC_P1  : 8.43395e-03 ± 7.20766e-04
  ADC_P2  : -6.13884e-06 ± 3.41338e-06
  CSA_Chi2/NDF : 1.33685e-04 / 2
  CSA_P0  : 5.93938e-02 ± 7.71194e-03
  CSA_P1  : 9.82708e-03 ± 5.81039e-04
  CSA_P2  : -4.81497e-05 ± 8.84853e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [10, 11, 15, 20, 35, 36, 48, 59, 60, 64, 65, 74, 84, 87, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [23, 25, 26, 34, 41, 50, 63, 66, 68, 69, 82, 93, 98, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3500', '1.800', '0.1378', '1.800', '0.0888', '7.000', '0.7072', 1, 1, 1, 1, 1724055395.5325985]
VI_after__Init : ['1.201', '0.3501', '1.800', '0.1379', '1.799', '0.0831', '7.000', '0.7070', 1, 1, 1, 1, 1724055403.5350316]
VI_at__the_End : ['1.201', '0.4840', '1.800', '0.1359', '1.799', '0.1135', '7.000', '0.7079', 1, 1, 1, 1, 1724055460.5277684]