TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_25_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-018-05 | FUSED_ID : 6359364768380289317
  IC_TEMP :  -50.70 | VDDM : 1126.56 | AUX_INT :   -9.25 | CsaBias :   78.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43243e-03 / 2
  ADC_P0  : -9.25429e-03 ± 2.56634e-02
  ADC_P1  : 7.99781e-03 ± 6.01273e-04
  ADC_P2  : -5.12098e-06 ± 2.80394e-06
  CSA_Chi2/NDF : 9.05357e-05 / 2
  CSA_P0  : 5.85706e-02 ± 6.34647e-03
  CSA_P1  : 9.60826e-03 ± 4.78161e-04
  CSA_P2  : -4.36205e-05 ± 7.28182e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [0, 24, 43, 44, 45, 59, 81, 87, 101, 103, 112, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [3, 11, 18, 20, 22, 26, 36, 41, 50, 90, 97, 98, 108, 118, 119, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1500', '1.800', '0.1255', '1.799', '0.0854', '7.000', '0.7076', 1, 1, 1, 1, 1724055926.7166924]
VI_after__Init : ['1.201', '0.1499', '1.800', '0.1254', '1.800', '0.0799', '7.000', '0.7076', 1, 1, 1, 1, 1724055934.6601126]
VI_at__the_End : ['1.202', '0.4864', '1.800', '0.1340', '1.800', '0.1112', '7.000', '0.7082', 1, 1, 1, 1, 1724055989.849976]