TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_27_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-019-05 | FUSED_ID : 6359364768380289333
  IC_TEMP :  -54.39 | VDDM : 1131.31 | AUX_INT :   -7.57 | CsaBias :   78.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08370e-03 / 2
  ADC_P0  : -7.56822e-03 ± 2.23154e-02
  ADC_P1  : 7.90197e-03 ± 5.22204e-04
  ADC_P2  : -4.89996e-06 ± 2.42226e-06
  CSA_Chi2/NDF : 1.23392e-04 / 2
  CSA_P0  : 5.92850e-02 ± 7.40909e-03
  CSA_P1  : 9.48406e-03 ± 5.58222e-04
  CSA_P2  : -4.27235e-05 ± 8.50106e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [7, 23, 26, 64, 67, 69, 78, 92, 112, 115, 119, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [11, 20, 22, 24, 30, 32, 34, 63, 67, 68, 69, 82, 95, 102, 104, 107, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2027', '1.800', '0.1425', '1.799', '0.0879', '7.000', '0.7080', 1, 1, 1, 1, 1724056033.562921]
VI_after__Init : ['1.201', '0.2027', '1.800', '0.1425', '1.800', '0.0804', '7.000', '0.7073', 1, 1, 1, 1, 1724056041.5300124]
VI_at__the_End : ['1.201', '0.4843', '1.800', '0.1327', '1.803', '0.1112', '7.000', '0.7082', 1, 1, 1, 1, 1724056097.6038356]