TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_29_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-020-05 | FUSED_ID : 6359364768380289349
  IC_TEMP :  -52.18 | VDDM : 1128.07 | AUX_INT :   -9.35 | CsaBias :   84.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72034e-03 / 2
  ADC_P0  : -9.34740e-03 ± 2.82213e-02
  ADC_P1  : 7.85603e-03 ± 6.64840e-04
  ADC_P2  : -4.15934e-06 ± 3.12650e-06
  CSA_Chi2/NDF : 1.12953e-04 / 2
  CSA_P0  : 5.67996e-02 ± 7.08876e-03
  CSA_P1  : 9.56037e-03 ± 5.34087e-04
  CSA_P2  : -4.32010e-05 ± 8.13352e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [2, 9, 16, 17, 46, 50, 52, 57, 65, 109, 118, 119, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [2, 20, 26, 30, 39, 44, 46, 62, 63, 72, 74, 79, 101, 102, 103, 106, 122, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1957', '1.800', '0.1507', '1.800', '0.0862', '7.000', '0.7075', 1, 1, 1, 1, 1724056140.100637]
VI_after__Init : ['1.201', '0.1959', '1.800', '0.1507', '1.801', '0.0812', '7.000', '0.7075', 1, 1, 1, 1, 1724056147.4109926]
VI_at__the_End : ['1.202', '0.4854', '1.800', '0.1338', '1.803', '0.1096', '7.000', '0.7083', 1, 1, 1, 1, 1724056202.6148603]