TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_30_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-021-05 | FUSED_ID : 6359364768380289365
  IC_TEMP :  -54.41 | VDDM : 1129.62 | AUX_INT :   -8.33 | CsaBias :   86.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19471e-03 / 2
  ADC_P0  : -8.32620e-03 ± 2.34137e-02
  ADC_P1  : 7.93958e-03 ± 5.45099e-04
  ADC_P2  : -5.17140e-06 ± 2.51731e-06
  CSA_Chi2/NDF : 1.23087e-04 / 2
  CSA_P0  : 5.66628e-02 ± 7.39994e-03
  CSA_P1  : 9.84256e-03 ± 5.57532e-04
  CSA_P2  : -4.59925e-05 ± 8.49055e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [8, 16, 19, 33, 34, 48, 50, 61, 62, 63, 65, 66, 70, 72, 74, 94, 98, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [17, 20, 37, 51, 56, 57, 58, 104, 107, 111, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1118', '1.800', '0.1382', '1.800', '0.0824', '7.000', '0.7074', 1, 1, 1, 1, 1724056246.3465033]
VI_after__Init : ['1.202', '0.1118', '1.800', '0.1382', '1.800', '0.0772', '7.000', '0.7075', 1, 1, 1, 1, 1724056254.3019123]
VI_at__the_End : ['1.201', '0.4902', '1.800', '0.1318', '1.799', '0.1116', '7.000', '0.7082', 1, 1, 1, 1, 1724056308.965744]