TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_32_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-016-022-05 | FUSED_ID : 6359364768380289381
  IC_TEMP :  -57.99 | VDDM : 1134.74 | AUX_INT : -279.58 | CsaBias : -126.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.63059e-04 / 2
  ADC_P0  : -2.79579e-01 ± 2.95719e-02
  ADC_P1  : 1.20467e-02 ± 6.28042e-04
  ADC_P2  : -1.91056e-05 ± 2.63236e-06
  CSA_Chi2/NDF : 8.23248e-05 / 2
  CSA_P0  : 5.78229e-02 ± 6.05184e-03
  CSA_P1  : 9.29080e-03 ± 4.55963e-04
  CSA_P2  : -3.80580e-05 ± 6.94377e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [0, 11, 12, 21, 34, 41, 45, 77, 78, 79, 81, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [2, 14, 17, 19, 58, 60, 64, 73, 75, 79, 81, 82, 84, 103, 105, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1601', '1.800', '0.1215', '1.799', '0.0841', '7.000', '0.7080', 1, 1, 1, 1, 1724056351.8844934]
VI_after__Init : ['1.202', '0.1600', '1.800', '0.1214', '1.800', '0.0766', '7.000', '0.7074', 1, 1, 1, 1, 1724056359.8359268]
VI_at__the_End : ['1.201', '0.4887', '1.800', '0.1327', '1.804', '0.1096', '7.000', '0.7085', 1, 1, 1, 1, 1724056415.8576553]