TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_52_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-017-013-15 | FUSED_ID : 6359364768380293343
  IC_TEMP :  -57.61 | VDDM : 1120.26 | AUX_INT :  -42.86 | CsaBias :   40.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39081e-03 / 2
  ADC_P0  : -4.28620e-02 ± 2.70490e-02
  ADC_P1  : 8.39703e-03 ± 6.21243e-04
  ADC_P2  : -6.55371e-06 ± 2.82381e-06
  CSA_Chi2/NDF : 1.20204e-04 / 2
  CSA_P0  : 5.77555e-02 ± 7.31277e-03
  CSA_P1  : 9.62196e-03 ± 5.50964e-04
  CSA_P2  : -4.64278e-05 ± 8.39053e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 25, 26, 28, 29, 34, 57, 63, 72, 76, 95, 111, 112, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [5, 9, 13, 32, 34, 39, 59, 61, 63, 69, 72, 82, 95, 102, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2577', '1.800', '0.1314', '1.799', '0.0901', '7.000', '0.7083', 1, 1, 1, 1, 1724057520.816598]
VI_after__Init : ['1.201', '0.2579', '1.800', '0.1314', '1.799', '0.0825', '7.000', '0.7073', 1, 1, 1, 1, 1724057528.7679324]
VI_at__the_End : ['1.201', '0.4746', '1.800', '0.1321', '1.804', '0.1137', '7.000', '0.7082', 1, 1, 1, 1, 1724057585.406418]