TEST_NAME : Wafer
TEST_DATE : 24_08_19-10_44_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-017-017-08 | FUSED_ID : 6359364768380293400
  IC_TEMP :  -53.74 | VDDM : 1128.55 | AUX_INT :   -7.75 | CsaBias :   81.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33323e-03 / 2
  ADC_P0  : -7.75012e-03 ± 2.48130e-02
  ADC_P1  : 8.17473e-03 ± 6.11684e-04
  ADC_P2  : -4.59927e-06 ± 2.99482e-06
  CSA_Chi2/NDF : 1.51367e-04 / 2
  CSA_P0  : 5.91519e-02 ± 8.20611e-03
  CSA_P1  : 9.95895e-03 ± 6.18271e-04
  CSA_P2  : -4.80516e-05 ± 9.41554e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 32, 35, 42, 44, 58, 82, 84, 111, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [4, 8, 11, 48, 69, 82, 83, 86, 87, 95, 101, 106, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2466', '1.800', '0.1223', '1.799', '0.0858', '7.000', '0.7083', 1, 1, 1, 1, 1724057095.8942878]
VI_after__Init : ['1.201', '0.2467', '1.800', '0.1222', '1.801', '0.0783', '7.000', '0.7076', 1, 1, 1, 1, 1724057103.916609]
VI_at__the_End : ['1.201', '0.4937', '1.800', '0.1364', '1.800', '0.1100', '7.000', '0.7083', 1, 1, 1, 1, 1724057160.015984]