TEST_NAME : Wafer
TEST_DATE : 24_08_19-11_04_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-018-009-01 | FUSED_ID : 6359364768380297361
  IC_TEMP :  -59.20 | VDDM : 1104.40 | AUX_INT :   -9.99 | CsaBias :   67.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62533e-03 / 2
  ADC_P0  : -9.99024e-03 ± 2.73440e-02
  ADC_P1  : 8.65814e-03 ± 6.89935e-04
  ADC_P2  : -6.05056e-06 ± 3.47345e-06
  CSA_Chi2/NDF : 1.86822e-04 / 2
  CSA_P0  : 5.70278e-02 ± 9.11667e-03
  CSA_P1  : 9.75833e-03 ± 6.86875e-04
  CSA_P2  : -4.80489e-05 ± 1.04603e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 19, 26, 32, 38, 45, 46, 78, 93, 106, 116, 119, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [0, 18, 23, 29, 30, 33, 47, 64, 72, 78, 82, 85, 90, 91, 92, 114, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2503', '1.800', '0.1402', '1.799', '0.0891', '7.000', '0.7083', 1, 1, 1, 1, 1724058260.129367]
VI_after__Init : ['1.201', '0.2504', '1.800', '0.1402', '1.800', '0.0820', '7.000', '0.7072', 1, 1, 1, 1, 1724058268.835718]
VI_at__the_End : ['1.201', '0.4774', '1.800', '0.1338', '1.803', '0.1130', '7.000', '0.7081', 1, 1, 1, 1, 1724058322.763511]