TEST_NAME : Wafer
TEST_DATE : 24_08_19-11_09_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-018-012-01 | FUSED_ID : 6359364768380297409
  IC_TEMP :  -63.92 | VDDM : 1117.01 | AUX_INT :   -9.57 | CsaBias :   58.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73036e-03 / 2
  ADC_P0  : -9.57259e-03 ± 2.82584e-02
  ADC_P1  : 8.49190e-03 ± 7.06051e-04
  ADC_P2  : -5.63329e-06 ± 3.51184e-06
  CSA_Chi2/NDF : 2.02624e-04 / 2
  CSA_P0  : 5.99732e-02 ± 9.49441e-03
  CSA_P1  : 1.04413e-02 ± 7.15335e-04
  CSA_P2  : -5.86432e-05 ± 1.08937e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [12, 13, 16, 28, 29, 37, 41, 44, 59, 92, 95, 116, 118, 119, 121, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 6, 7, 14, 25, 26, 44, 51, 58, 75, 83, 98, 99, 111, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3162', '1.800', '0.1401', '1.799', '0.0939', '7.000', '0.7073', 1, 1, 1, 1, 1724058579.947505]
VI_after__Init : ['1.201', '0.3166', '1.800', '0.1401', '1.800', '0.0880', '7.000', '0.7074', 1, 1, 1, 1, 1724058587.8688726]
VI_at__the_End : ['1.201', '0.4801', '1.799', '0.1347', '1.799', '0.1146', '7.000', '0.7080', 1, 1, 1, 1, 1724058642.1416683]