TEST_NAME : Wafer
TEST_DATE : 24_08_19-11_14_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-018-015-01 | FUSED_ID : 6359364768380297457
  IC_TEMP :  -60.61 | VDDM : 1120.58 | AUX_INT :   -8.72 | CsaBias :   59.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17080e-03 / 2
  ADC_P0  : -8.71907e-03 ± 2.31469e-02
  ADC_P1  : 8.55766e-03 ± 5.74856e-04
  ADC_P2  : -6.26533e-06 ± 2.83671e-06
  CSA_Chi2/NDF : 1.69379e-04 / 2
  CSA_P0  : 5.88631e-02 ± 8.68066e-03
  CSA_P1  : 9.97126e-03 ± 6.54025e-04
  CSA_P2  : -5.10586e-05 ± 9.96002e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [12, 20, 21, 37, 40, 41, 45, 50, 64, 77, 79, 84, 86, 87, 91, 95, 96, 108, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [20, 32, 56, 59, 61, 67, 92, 96, 103, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1517', '1.800', '0.1272', '1.799', '0.0824', '7.000', '0.7081', 1, 1, 1, 1, 1724058899.0108387]
VI_after__Init : ['1.201', '0.1517', '1.800', '0.1272', '1.801', '0.0751', '7.000', '0.7075', 1, 1, 1, 1, 1724058907.05817]
VI_at__the_End : ['1.201', '0.4798', '1.800', '0.1366', '1.803', '0.1156', '7.000', '0.7078', 1, 1, 1, 1, 1724058962.9728577]